Prof. Songlin Zhuang, academician of the Chinese Academy of Engineering visited Enlitech’s laboratory!

Prof. Songlin Zhuang, academician of the Chinese Academy of Engineering visited Enlitech’s laboratory!


Songlin Zhuang, academician of the Chinese Academy of Engineering, was invited to our laboratory headquartered in Taiwan on May 23rd 2014, discussing the state of photovoltaic industrial development and technologies in Asia, giving the opinions on the differences between Chinese and Taiwanese national competitive advantages. Furthermore, Prof. Songlin Zhuang witnessed the signing ceremony for joint laboratory between Enlitech and the University of Shanghai for Science and Technology which aims to enhance research and development in photovoltaic fields.


* Prof. Songlin Zhuang witnessed the signing ceremony for joint laboratory between Enlitech and the University of Shanghai for Science and Technology

Prof. Songlin Zhuang, whose research has been focused on applied optics and photonics, was elected as an academician of the Chinese Academy of Engineering in 1995. Currently, Prof. Songlin Zhuang is dean of school of optical-electrical and computer engineering at University of Shanghai for Science & Technology. He is also Chairman of China Instrumentation Society, and fellow of the international society for optics and photonics (SPIE) and the Optical Society (OSA).

Enlitech has been committed to researching, developing and manufacturing high-quality photovoltaic products for years, and our goal is always to be able to provide the best solutions to our worldwide customers. We were pleased to know that Prof. Songlin Zhuang highly appreciated our product MV-IS CCD/CMOS image sensor and cameras characterization measurement which was adopted by the University of Shanghai for Science and Technology. Enlitech’s MV-IS is used to measure the quantum efficiency/spectral response/IPCE and other parameters of sensor and camera. The measurement wavelength can be extendable to 200 nm~1100 nm. Enlitech’s patent uniform light system provides a greater intensity than a traditional integrating sphere. Besides, the unique design for monochromator light, which enables the wavelength resolution to be up to 0.1nm and make the measurement more accurate.


* MV-IS Image Sensor Characterization System

We were really honored to have a technical exchange meeting with Prof. Songlin Zhuang and have him here to witness the signing ceremony for joint laboratory between Enlitech and the University of Shanghai for Science and Technology. We sincerely look forward to the close cooperation working with Chinese academics to boost the development of photovoltaic fields.
2014-06-18