S6 is a solar cell spectral response measurement system designed by Enli Technology Co., Ltd.,
and also is the first modular full-area (156×156 mm2 ) illumination equipment in the world,
can measure the spectral response of the whole cell. The full-area result resembles the overall
cell response better and can be utilized to calculate the Spectral Mismatch Factor according to
IEC standard. This resolves the situations when localized-area measurement or mapping results
might misrepresent the whole cell. It is now implemented by target research centers and major
cell manufacturers to improve the conversion efficiency of solar cells.
a. Spectral response measurement for full-size cell (absolute error <0.5%)
b. Spectral response linearity test of solar cells to analyze the cell characteristic under different light intensity.
c. Analyze the cell loss by using full-size spot size and small spot size.
d. Equipped with the measurement function of mini module.
e. High irradiance of monochromatic light: can reach 2.5 uW/cm2 .
f. Equipped with high irradiance bias light system: 0.3 suns (canchoose 1 sun component as optional function).
g. High speed and stable temperature control ability.
h. High repeatability:≦ 0.1 % and reproducibility≦ 0.3 %.
i. Measurement solution for rapid reflection distribution (optional function).
a. 6" monocrystalline silicon solar cell, polysilicon solar cell, and variety of high efficiency solar cell.
b. 6" independent packaged solar cell.
c. 6" bifacial solar cell.
a. EQE, Reflection and IQE.
b. Current loss analysis.
a. 300 W Xe lamp.
b. High efficient lamp with elliptical reflector system.
c. Provide 300~2000 nm continuous light.
d. Equipped with three-axis adjustment knob, XYZ distance:±5mm, resolution: 10 μm.
e. Lamp timer.
a. Czerny-Turner monochromator.
b. Wavelength resolution: ≦1 nm.
c. Width of monochromatic light: ≦20 nm in accordance with IEC 60904-8:2014.
d. Scanning range: 0.1 nm-50 nm, default value: 10 nm.
a. Measurement range: 300-1200 nm..
b. Illumination area: rectangle spot ≧180 x 180.
c. Uniformity of monochromatic light: ≧ ±95 % (≦160 x 160 mm2) @530 nm.
d. Scanning step size: 0.5nm ~25nm, can be set up by users.
a. Frequency: 4~500 Hz.
b. Can be controlled by computer.
c. Frequency resolution: 0.01 Hz, stability: < ±0.05 Hz.
d. Stable time for frequency adjustment: <3 second.
a. Optical filter wheel.
b. 4 filters.
c. Can be controlled automatically and manually. Equipped with LED monitor to show the present location.
|Bias Light System||
a. Comply with IEC 60904-9 standard.
b. Irradiance of bias light system：6” spot size: 0-0.5 Sun，small spot size: 0-2 Sun.
c. Illumination area: ≥160 x 160 mm2.
a. DSP lock-in amplifier.
b. Pre DC filtration module.
c. 5 Amps/5 V DC capability.
d. Extend Max filtering current capability to 10 Amp (Optional Function).
e. Bandpass filter function can filter the interference signal automatically.
f. Dual-phase lock-in amplifier to monitor the sample signal and light intensity signal.
g. Auto signal switching function.
|Gold Plate Sample Stage||
a. 6” standard gold coating plate for silicon solar cells.
b. Vacuum suction with vacuum pump (7 L/min).
c. Probe stage *4, Kelvin probe which is available to 3, 4, 5 bus bars.
d. Equipped with 4 probes which can measure the current and voltage independently to reach the connector of Kelvin probe.
a. Light intensity calibration.
b. Spectral response measurement.
c. External quantum efficiency measurement (EQE).
d. Auto and immediate short-circuit current density (Jsc) calculation.
e. Data analysis function.
a. IPC, LCD Monitor.
b. Official Windows Operation System.
a. Electricity Leakage Breaker.
b. No Fuse Breaker, max 50 A.
|Measurement Function for Small Illumination Area||
a. Illumination mode：1 mm width.
b. Wavelength range: 300-1200 nm.
c. Can measure EQE, IQE, reflection and transmission.
d. IQE and EQE in-situ measurement.
e. White bias light: 0-2 Sun.
f. Calibration detector：Si for 300 -1100 nm and Ge for 900 -1200 nm, with NIST traceable report.
g. BNC connector.
h. Area: 10×10 mm2, non-uniformity: 5 ‰.
i. Computer control the detector channel.
j. Standard reflection white plate: 300-1200 nm, traceable to NIM.
a. System dimension: 1750 mm x 1746 mm x 1038 mm.
|Optional Function: Auto-mapping Function||
a. XY axis auto stage.
b. X, Y axis moving distance: ±100 mm.
c. Repositioning resolution: ±0.02 mm.
d. Moving resolution (minimum): 2.5 μm.
e. Precision ball screw drive shaft.
f. Precise slide rail.
g. Maximum horizontal load: 9 kg.
h. Maximum vertical load: 2.5 kg.
i. Equipped with protection chain for slide rail.
j. Moving method：automatic.
k. Equipped with photo interrupt safety devices at both ends.
l. Can do the light intensity calibration automatically.
m. Automatic LBIC scanning function and quantum efficiency measurement of single wavelength (need to equip with reference detector), 2D and 3D display.
n. Measurement time of LBIC: 0.25 S/point.
o. Non-repeatability: <±2 %.
p. Multi-point EQE and IQE measurement.
q. Coordinate set up function for multi-point quantum efficiency measurement.
r. Pre-moving function (equipped with position modification function and users can save new coordinate).
|Optional Function: Integrating Sphere for Vertical Incident||
a. Reflection measurement by integrating sphere.
b. Equipped with 2” integrating sphere, barium sulfide coated.
c. 1.4 cm aperture.
d. Vertical incident.
Designed in accordance with IEC 60904-8, such that the measurement results meet the requirements of metrology institute.
◆ Current loss analysis:
Large measurement space, suitable for 3x3 small module, and full module.