PL/EL/TCSPC/DBR Mapping (1)

SLI-PE-M200 Photoluminescence Imaging Measurement System

● TRPL/PL/EL/LBIC/Reflectance integrated system.
● Fast mapping method and algorithm approach.
● Multi excitation wavelength capability.
● Industrial analysis tool.
● Flexible design: offer 4-inch, 6-inch and 8-inch total solution.

Time-Resolved Photoluminescence (1)

● High accurate capability of measuring carrier lifetime.
● Unique and adjustable pulsed light source fits materials with different types of carrier lifetime.
● User friendly control software, one-touch carrier lifetime measurement software.
● Powerful hardware extension satisfies various high-end measurement and analytical requirements.
● Flexible sample chamber design satisfies liquid and solid sample applications.
● Sampling capability up to 32678 passage of time.

Laser Scanning Defect Mapping (1)

LSD4 Laser Scanning Defect Mapping System

● Can scan the photocurrent distribution of the sample surface.
● Can scan the open-circuit voltage and short-circuit current distribution.
● Can analyze the surface dust of the solar cell.
● Can analyze the short-circuit area.
● Can analyze the diffusion length of minority carrier.
● Can recognize and analyze the defects.
● PV Response Mapping can equip with white light excitation source.

Laser Scanning Confocal (1)

SPCM-1000 Laser Scanning Confocal

● Total Laser-scanning Fluorescence Confocal Microscope System.
● Non-damage and high resolution fluorescence imaging.
● User-friendly interface and easy to maintain.
● Fluorescence spectrum measurement on the nanometer scale.
● Imaging pixel: 4096 x 4096 (maximum).
● Can extend the Time-Correlated Single Photon Counting (TCSPC) function.
● Can extend the Fluorescence Lifetime Imaging Microscope function.