Photoluminescence Imaging Measurement System (1)

SLI-PE-M200 Photoluminescence Imaging Measurement System

● TRPL/PL/EL/LBIC/Reflectance integrated system.
● Fast mapping method and algorithm approach.
● Multi excitation wavelength capability.
● Industrial analysis tool.
● Flexible design: offer 4-inch, 6-inch and 8-inch total solution.

Laser Scanning Defect Mapping System (1)

LSD4 Laser Scanning Defect Mapping System

● Can scan the photocurrent distribution of the sample surface.
● Can scan the open-circuit voltage and short-circuit current distribution.
● Can analyze the surface dust of the solar cell.
● Can analyze the short-circuit area.
● Can analyze the diffusion length of minority carrier.
● Can recognize and analyze the defects.
● PV Response Mapping can equip with white light excitation source.