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Image Sensor Characterization System
Items | Specification |
---|---|
Monochromatic Light Source |
a. Instability <1% b. Cooling system c. Ozone Removal system d. 300nm~1100nm (Extensible) e. Grating monochromatic light f. Continuously adjustable irradiation power: 0~100% g. Resolution: 0.1 nm h. Wavelength Accuracy: ±1nm i. Wavelength Repeatability: ±0.5nm |
Uniformity System-A |
a. MV-IS Optical system, spot size 30 mm × 30 mm,designed in accordance with the chip size of CCD and CMOS b. Spot uniformity ≥99% c. Position of uniform light: a distance of 150 mm from the exit of the uniformity system d. Intensity of uniform light:>5 μw/cm2 e. Continuously adjustable irradiation power f. Pixel QE Measurement:Yes(sufficient light intensity) g. Beam-divergence angle: <5°(customized) |
Uniformity System -B |
4”Integrating sphere, uniformity 99 % |
Detector |
a. BNC interface b. Wavelength Range 190 nm ~ 1100 nm c. NIM traceable Certificate d. Area: 10 × 10 cm2, Nonunifornity 0.5% e. Min. resolution of picoammeter: 10 fA |
Control System |
the latest Industrial computer, LCD, 4GB RAM, DVD, Windows7 system |
Measurement Dark Room |
Black coating which can keep out the stray lights. |
Image Capture Interface |
USB, IEEE, 1394 and BNC |
Sample Stage |
3-axis adjustment stage, Sample holder, Laser positioning function |
Software and development tool |
a. Integrated system-control sofware b. Development tool c. Monochromator control d. Filter wheel control e. Picoammeter control f. Automatic stage control (Optional) g. Customizable measurement software (Optional) |
● Exclusive uniform light system and high monochromatic light intensity
● Full array pixel measurement
● Divergence angle < 5°
● Multiple camera interface
● Is capable of hardware expansion and system upgrade
● Laser positioning
◆ Integration Soultions:
The system provides the solutions for the photon transfer method measurement:
● Quantum Efficiency/Spectral Response
● Sensibility
● Dynamic Range
● Dark Current /noise
● Linearity Error LE
● Dark current non-uniformity
● Photo response non-uniformity
● Chief Ray Angle, CRA
● CCD camera
● CMOS camera
● UV sensor
● Infrared light sensor
● Camera
● Other optoelectronic devices
(a) The divergence
angle of patent
uniform light system
|
(b) The divergence
angle of Traditional
integrating sphere.
|
(c) light spot |
(d)The system
can provide
monochromatic
light over a
continuous range
of wavelengths.
|
▲Figure 2. The measurement results for the industrial camera @ 470 nm wavelength.
▲Figure 3. The measurement results of Quantum Efficiency for the industrial camera at 300 nm - 1100 nm
▲Figure 4. The comparison of irradiance between Enlitech’s exclusive uniform light system and a traditional integrating sphere.
▲Figure 5. The comparison of Photon Flux between Enlitech’s patent uniform light system and a traditional integrating sphere.
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430 nm Uniformity 99.04% |
530 nm Uniformity 99.06% |
|
630 nm Uniformity 99.05% |
▲Figure 6. Enlitech’s patent uniform light at diferent monochromatic light wavelengths, the uniformity can be up to 99%