Image Sensor Characterization System

Complete turn-key solution for image sensor testing and characterization
Model : MV-IS

MV-IS is a high-performance measurement system of CCD/CMOS image sensor and camera systems for a variety of applications. The measurement wavelength can be extendable to 300 nm~1100 nm. Enlitech's patent uniform light system provides a greater intensity than a traditional integrating sphere. Besides, the unique design for monochromator light, which enables the wavelength resolution to be up to 0.1nm and make the mesurement more accurate.
Items Specification
Monochromatic Light Source a. Instability <1%
b. Cooling system
c. Ozone Removal system
d. 300nm~1100nm (Extensible)
e. Grating monochromatic light
f. Continuously adjustable irradiation power: 0~100%
g. Resolution: 0.1 nm
h. Wavelength Accuracy: ±1nm
i. Wavelength Repeatability: ±0.5nm
Uniformity System-A a. MV-IS Optical system, spot size 30 mm × 30 mm,designed in accordance with the chip size of CCD and CMOS
b. Spot uniformity ≥99%
c. Position of uniform light: a distance of 150 mm from the exit of the uniformity system
d. Intensity of uniform light:>5 μw/cm2
e. Continuously adjustable irradiation power
f. Pixel QE Measurement:Yes(sufficient light intensity)
g. Beam-divergence angle: <5°(customized)
Uniformity System -B 4”Integrating sphere, uniformity 99 %
Detector a. BNC interface
b. Wavelength Range 190 nm ~ 1100 nm
c. NIM traceable Certificate
d. Area: 10 × 10 cm2, Nonunifornity 0.5%
e. Min. resolution of picoammeter: 10 fA
Control System the latest Industrial computer, LCD, 4GB RAM, DVD, Windows7 system
Measurement Dark Room Black coating which can keep out the stray lights.
Image Capture Interface USB, IEEE, 1394 and BNC
Sample Stage 3-axis adjustment stage, Sample holder, Laser positioning function
Software and development tool a. Integrated system-control sofware
b. Development tool
c. Monochromator control
d. Filter wheel control
e. Picoammeter control
f. Automatic stage control (Optional)
g. Customizable measurement software (Optional)

● Exclusive uniform light system and high monochromatic light intensity
● Full array pixel measurement
● Divergence angle < 5°
●  Multiple camera interface 
● Is capable of hardware expansion and system upgrade
● Laser positioning

◆ Integration Soultions:
The system provides the solutions for the photon transfer method measurement:

● Quantum Efficiency/Spectral Response
●  Sensibility
● Dynamic Range 
● Dark Current /noise 
●  Linearity Error LE
●  Dark current non-uniformity 
● Photo response non-uniformity
● Chief Ray Angle, CRA

● CCD camera
● CMOS camera
●  UV sensor
●  Infrared light sensor
●  Camera
●  Other optoelectronic devices


(a) The divergence 
angle of patent 
uniform light system
(b) The divergence
angle of Traditional
integrating sphere.

(c) light spot

   (d)The system 
   can provide 
   light over a 
   continuous range
   of wavelengths.

Figure 1. MV-IS system can provide the monochromatic light beam with high uniformity and light intensity, 
and also a high signal-to-noise ratio, which makes the measurement more accurate. 

Figure 2. The measurement results for the industrial camera @ 470 nm wavelength. 

Figure 3. The measurement results of Quantum Efficiency for the industrial camera at 300 nm - 1100 nm

Figure 4. The comparison of irradiance between Enlitech’s exclusive uniform light system and a traditional integrating sphere.

Figure 5. The comparison of Photon Flux between Enlitech’s patent uniform light system and a traditional integrating sphere.

430 nm 

Uniformity 99.04%

530 nm 

Uniformity 99.06%

630 nm 

Uniformity 99.05%

Figure 6. Enlitech’s patent uniform light at diferent monochromatic light wavelengths, the uniformity can be up to 99%

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Coming soon!