FLIM and PL Image Confocal Scanning Image System

Model : SPCM-1000

●  Total Laser-scanning Fluorescence Confocal Microscope System
●  Non-damage and high resolution fluorescence imaging
● User-friendly interface and easy to maintain
● fluorescence spectrum measurement on the nanometer scale
● Imaging pixel: 4096 x 4096 (maximum)
● Can extend the Time-Correlated Single Photon Counting (TCSPC) function
● Can extend the Fluorescence Lifetime Imaging Microscope function
● Confocal
●  Microscopy
● TRPL,Time-Resolved Photoluminescence
● FLIM,Fluorescence Lifetime Imaging Microscopy

Items Specifications
Main Frame a. Fluorescence wavelength range: 400 nm-900 nm (can be extend to 1700 nm as optional function)
b. Scanning core: Galvo-based XY scanners
c. Scanning mode: uni-direction/ bi-direction
d. Scanning resolution: <4096 x 4096
e. Scanning speed:2 fps bi-directional scanning (Maximum)
f. Data bits: 16-bit
g. Scanning Zoom-in: 1-80 x
h. Scanning methods:
  • 1D: Line Scan, Time Trace, single-point spectrum
  • 2D: XY, Line+T
  • 3D: XYZ, XYT, XYλ
  • 4D: XYZT, XYλZ, XYλT
  • 5D: XYZλT
i. Signal Input: Dual Channel
j. Filter wheel for automation laser controlling: Supports 4 different wavelengths of lasers (maximum)
k. Dual output switching design
  • Photon Counting Detector (Standard Function)
  • Spectrometer (Optional Function)
Laser a. Wavelength range 405 nm +/-3 nm (Can be adjusted according to customers’ requirement)
b. Bandwidth: 0.52 nm
c. Maximum intensity: >20 mW
d. Power Stability: <2% RMS< br /> e. Optical output: 25 µm MM fiber
Detector a. Multialkali photocathode detector
b. Range: 185 nm-900 nm (Can be adjusted according to customers’ requirement)
c. Equipped with photon counter
d. Quantum yield: 32% @ 450 (maximum)
XYZ Stage a. Main frame: Olympus BX-43
b. XY handle position: right hand side
c. XY full range: 76 mm x 52 mm
d. Z axis full range: 25 mm
e. Z axis adjustment: 100 um/rev ; resolution: 1 um
Microscope System a. LED based Kohler illumination light source
b. Standard model with 20 x PLN and 50 x PLN Objective
c. Detector pixels: 1.3 MP
d. Detector: color CMOS
f. Communication port: USB
g. Field of view: 850 µm (@ 20 x objective)
Signal Capture System a. Bus interface: PCIe
b. Analog input channels: 8
c. Analog sampling rate: <500 kS/s
d. Analog input ADC resolution: 16-bit
e. Analog output channels: 2
f. Analog output maximum update rate: <900 kS/s
g. Analog output DAC resolution: 16-bit
h. Digital I/Os: 24
i. Counters: 4
j. Counter resolution: 32-bit
k. Internal Base Clock: 100MHz
Computer a. Official windows 7 pro operation system
b. IPC
c. LCD monitor

Description of Objective Magnification and Imaging Resolution:

Parameters for Lens
Magnification 1.25x 5x 10x 20x 50x 50x L 100x 100x L
Field of view(µm) 11200 2800 1400 700 280 280 140 140
NA 0.04 0.1 0.25 0.4 0.75 0.5 0.9 0.8
Beam spot size (µm)* 12.5 5 2 1.3 0.7 1 0.6 0.65
Working distance(mm)
5 20 10.6 1.2 0.6 10.6 0.21 3.4
17.3 10.8 13.5 10.8 8.1 5.4 4.9 4.3
*All data are calculated for 405nm Laser diffraction-limit criterion

Study Application 1.

● High resolution laser scanning confocal image
● For studying perovskite solar cell grain-boundary structures and surface morphology
● Grain size of perovskite solar cell is a key factor of solar conversion efficiency. Utilize laser scanning confocal microscope, we would be able to investigate the grain size even if the solar cell is made into device.
● A high resolution 1024x1024 image can be acquired less than 5 second.
● Meanwhile, if sample have regional distributions, users can use ROI to investigate different areas without any sample moving.

Figure 1:Image of wide field microscope

Figure 2:Images of laser scanning confocal microscopes

Study Application 2. 

● Study in micro-scale perovskite grain boundary defects
● Defects in perovskite solar cell will be reflected on PL characteristics. Utilizing PFCM-1000, we can not only see the grain boundary distribution by its PL intensity, but also detect PL spectrum by setting ROI for micro-scale spot less than 1µm, which could be indications for defect structure to improving the manufacture.

Study Application 3. 

● Combine laser scanning confocal microscope with TCSPC(Time Correlate Single Photon Counting)
● PL intensity is an indicator for viewing defects in perovskite solar cell grain boundary. However, if we would like to study further into carrier recombination and carrier dynamics by optics, we should combine time correlate techniques. Earlier studies already pointed out that energy transfer efficiency has direct correlation with TRPL(Time-Resolved Photon Luminance).
● Utilize confocal microscope, we are able to investigate micro-scale difference of TRPL between spots that smaller than 1µm.

Study Application 4. 

● FLIM(Fluorescence lifetime imaging microscope)
● By synchronizing TCSPC system with laser scanning confocal microscope, we are able to measure 2D optics intensity distribution and PL decay time of in the same time. As images showed below, we can clearly understand that higher intensity of local area is contributed by longer PL decay time.
● FLIM is total investigation for our enclosed device.

Study Application 5. 

● 3D confocal imaging
● Traditional wide field microscope image can’t resolve depth information. Thus, in help of optical section ability of laser scanning confocal microscope, we are able to get images of device that represented for different Z positions by a non-destructive method.

Figure 1. optical sectioning of sample

Figure 2. 3D structures of device

Coming soon!

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