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Quantum Efficiency/ Spectral Response/ IPCE Measurement System
Designed in accordance with IEC 60904-1, 60904-7, 60904-8
High-efficiency light elliptical reflector:
Czerny-Turner multi-diffraction gratings monochromator:
Dual-beam optical design:
Signal multiplexer:
Signal-to-noise ratio can reach 100 dB, the result of the overall system optimization
DC mode function for DSSC solar cells
High uniformity detector
Item | Specifications |
---|---|
Quantum Efficiency Measurement System |
a. Wavelength range:300-1100 nm (can be extended) b. Repeatability:
d. The repeatability= 100% * (max - min)/(max + min) e. Measurement time: less than 3 minutes from 300-1100 nm (scan interval: 10 nm) f. Shielding Enclosure: 60 cm |
Lamp System |
a. 75 W Xe b. Wavelength range: 250-1800 nm (EQE and IQE) c. Highly efficient and high reflectivity elliptical reflector system d. Can provide continuous spectrum from 300-2500 nm e. Switching mechanism for dual lamp system f. Switching distance: 75 mm g. Switching resolution: ±0.05 mm h. Switching speed: 10~200 mm/s i. Fluctuation: <0.1 % (Use the lock-in to get multi-point measurement result under 530 nm) j. Long term instability: <0.2% within 3 hours (Measure the silicon detector as the standard sample per hour and find the average value for full measurement range) (Average ( | EQE_3H – EQE_0H | / (3Hr) ) = stability (%/Hr)_average value) k. Lamp timer |
Monochromator |
a. Czerny-Turner monochromator b. Focal length: <120 mm c. F/#: ≦3.9 d. Stray light <10-5 e. Wavelength resolution: ≦1% f. Scanning step: 0.1 nm-50 nm, normally 10 nm |
Optical System |
a. Illumination light spot:
c. Reflector Reflectivity: >75% for full wavelength range d. Monochromatic light intensity: 2 mW/cm2 @ 530 nm e. Incident angle: 8° f. Efficient working distance: >10 cm |
Chopper |
a. Frequency: 10~450 Hz b. Can be controlled by computer c. Resolution: 0.01 Hz, stability: < ±0.05 Hz d. Stabilization period: <3 seconds |
Filter Wheel |
a. Optical controlled filter wheel b. Can be controlled manually and automatically c. LED display to indicate the present filter setting position d. Equipped with 4 filters |
Lock-in Amplifier |
a. Two DSP lock-in amplifiers b. Maximum acquisition speed <25 us (signal) c. Two DSP simultaneous working mode speed <50 us d. Time delay between two amplifiers <1 us e. Time constant: 0.001~100 sec, user setting f. Roll-off filter g. RXYθ measurement function h. Interface: USB i. Maximum gain: 107 j. Maximum sensitivity: 1 nA k. Maximum input voltage: 10 V l. Bandpass filter function can filter the interfering signal automatically m. Automatic channel switch function |
Calibration Detector |
a. Si detector 300-1100 nm b. BNC connector c. 10 x 10 mm2, non-uniformity: 5 ‰ d. NIST traceable report e. Computer controlled detector channel |
Monitor Module |
a. Standard monitoring module b. Monitoring range: similar to EQE wavelength range c. Lock-in amplifier for feedback circuit d. DSP lock-in input e. Immediate monitoring ability |
Software |
a. Light intensity calibration b. Spectral response measurement and external quantum efficiency measurement c. Automatic and immediate short-circuit current density calculation d. Automatic short-circuit current calculation for single wavelength e. Internal quantum efficiency calculation software f. Band gap analysis g. Data collection and analysis function h. Spectral mismatch factor calculation i. Signal monitoring function j. Jsc Integration k. QE curve normalization l. TXT data saved formula |
Oscilloscope Module |
a. Oscilloscope display window b. Ability of time domain signal and frequency domain signal analysis and displaying c. Maximum time domain: 10 S d. Signal monitoring function: can monitor the photon current variation of test sample e. Two independent channels for EQE and IQE f. Analog input resolution: 14 Bits (ADC: Analog Digital Converter) g. Maximum resolution of sampling rate: 48 KS/s h. Maximum voltage display: ±10 V, accuracy: 7.73 mV i. Minimum read current: 1 nA |
Computer |
a. Computer with LCD monitor b. Official Windows 7 c. RS232 communication port |
Shielding Enclosure |
a. Compact system b. Shielding enclosure to avoid the stray light c. 60 cm operation space |
Optional Model | Optional Item | Specifications |
---|---|---|
QE-R-RCG3018 | EQE Measurement Extend to 1800 nm |
a. EQE measurement for NIR range b. Standard Ge detector for 900-1800 nm c. System wavelength range: 300-1800 nm d. Lock-in channel for Ge detector e. With calibration report f. Software for NIR range |
QE-R-IS3011 | Internal Quantum Efficiency Measurement Function |
a. 2” integrating sphere with barium sulfide coating material b. Integrating sphere aperture: 1.4 cm c. Incident angle: 8° d. IQE and EQE can be measured at the same point e. Reflectivity and internal quantum efficiency measurement function f. Measurement range: 300-1100 nm g. Si detector h. Standard reflection white board with traceable report i. Average repeatability ≧±99 % j. Illumination area: same size as EQE k. Si detector has response up to 1150 nm (the calibration traceable report is from 300-1100 nm, above 1100 nm, we need to upgrade to wider range spectrum as 1800 nm) |
QE-R-IS3018 | Internal Quantum Efficiency Measurement Function |
a. 2” integrating sphere with barium sulfide coating material b. Integrating sphere aperture: 1.4 cm c. Incident angle: 8° d. IQE and EQE can be measured at the same point e. Reflectivity and internal quantum efficiency measurement function f. Measurement range: 300-1800 nm g. Si/Ge detector h. Standard reflection white board with traceable report i. Average repeatability ≧±99 % j. Illumination area: same size as EQE |
QE-R-T | Transmission Measurement Function |
a. Provide the customized holder for transmittance measurement around the center area of sample under test b. Integrating sphere mode c. Measurement wavelength is similar to IQE d. Light spot is similar to EQE |
QE-R-DC | DC Mode |
a. DC mode b. Mechanical switcher bar and users can change from AC mode to DC mode in 1 second c. DC mode software d. Measurement delay setting e. Support multiple acquisition and average f. Instant data display g. Active low-frequency pass filter @ 1k Hz h. Default Gain setting: >106 i. Acquisition precision >14 bit j. Acquisition speed > 50 us per point k. Max acquisition points >10,000 l. The repeatability ≧±99 % |
QE-R-DL | Dual-lamp System |
a. 75 W Xe and 150 W QTH lamp b. Current instability: Xe< 0.5%, QTH<0.1% c. Wavelength range: 300-1800 nm (EQE and IQE) d. Highly efficient and high reflectivity elliptical reflector system e. Can provide continuous spectrum from 300-2500 nm f. Switching mechanism for dual lamp system g. Switching distance: 75 mm h. Switching resolution: ±0.05 mm i. Switching speed: 10~200 mm/s j. Lamp timer |
QE-R-B0505 | Minimized Beam Size Module |
a. Irradiance area: 0.5 mm x 0.5 mm square b. Optical lens c. Signal amplifier circuit d. Secondary magnification ability |
QE-R-VB05 | Voltage Bias Function |
a. Voltage bias: 0-±5 V b. Resolution: 1.22 mV c. Software setup function |
QE-R-VB10 | Voltage Bias Function |
a. Voltage bias:0-±10 V b. Resolution: 1.22 mV c. Software setup function |
QE-R-LB | White Light Bias Module |
a. 150 W halogen lamp b. 0-2 Sun intensity, adjustable c. 1 m fiber d. Optical lens and mount e. X axis sliding stage with magnet f. Safety interlock g. Cooling system: air cooling |
QE-R-DJ | Double-junction Measurement Module |
a. 150 W halogen lamp b. 0-5 Sun intensity, adjustable c. 1 m fiber d. Optical lens and holder e. X axis sliding stage with magnet f. Safety interlock g. Cooling system: air cooling h. Two filters: 550 nm, 700 nm i. Double-junction measurement software |
QE-ST-SI | Conductive Plate Sample Stage |
a. 6” standard gold-plated measurement stage b. Vacuum absorption function c. 7 L/min vacuum pump d. Z axis probe *2 e. Needle tip:0.5 mm f. Platform for reference cell g. Adjustable balance leg*4, adjustable range: 30 mm h. BNC connecter |
QE-ST-OP | Sample Stage for Thin Film |
a. Standard sample stage for thin film b. IC clip * 1 c. Three axis micropositioner, distance: ±3 mm, resolution: 0.01 mm, can load 10 Kg (maximum) d. Resolution: 10 um e. Platform for placing detector f. 6-channel knob g. Can support 6 sub-cell (maximum), the distance of each cell should be 2.54 mm |
QE-ST-DS | Multifunction Thin Film Sample Stage |
a. Multifunction thin film sample stage b. IC clip * 2 c. Can measure unilateral sample and bilateral sample d. Platform for placing detector e. 6-channel knob f. Adjustable balance leg* 4, height can be adjustable g. Can support 6 sub-cell (maximum), the distance of each cell should be 2.54 mm |
QE-BT-BOX | Back Contact Probe Sample Box |
a. Back contact probe sample box b. 0.475 mm round needle tip spring probe c. Spring probe range: 2mm d. Upper cover with magnet e. Customized probe position f. Can support the sample size: 20 mm (L) x 20 mm (W) x 2 mm (H) (maximum) g. Can support 6 sub-cell (maximum) |
QE-ST-FL | Flip Stage |
a. The stage platform can rotate 180 degree b. Z axis probe* 2 c. Sample size should less than 2.5 cm x 2.5 cm |
QE-R-FB | Optical Fiber Illumination Module |
a. Measurement range: 300-1100 nm b. Fiber switching bar for user to change the light direction c. 4.5 meters fiber d. Fiber condensing lens e. Illumination area: 1 mm (diameter) f. Fiber mount |
QE-R-GI | Glove Box Integration Kit |
a. Measurement range: 300-1100 nm b. Fiber switching mechanism. EQE can be tested in the glove box and outside the glove box c. 4.5 meters fiber d. KF40 seal flange e. Fiber condensing lens f. Illumination area: 1mm (diameter) g. Light direction from top to bottom h. Sample stage for the glove box with BNC connector, IC clip and mount for fiber installation i. Sample channel switch box j. Black cloth to avoid the stray light k. XY axis sliding stage l. XY axis move range is ±12.5 mm, accuracy: 0.01 mm m. BNC signal connecter |
QE-R-mapping | Auto-mapping scanning function |
a. XY axis auto-mapping stage b. XY axis range: ±100 mm c. Accuracy: ±0.02 mm d. Resolution: 2.5 μm e. Movement mode: auto control f. Safety protection device g. Automatic light intensity calibration h. LBIC measurement function, 2D and 3D display i. LBIC measurement time: 0.25 S/point j. Repeatability >±2 % k. Multi-position EQE, IQE measurement function l. Multi-position coordinates pre-setup function m. Stage pre-move function |
QE-R-MJ | LED Multi-junction Solar Cell Measurement Module |
a. 4 high light intensity LED light bias b. Automatic software c. 4 independent channel controller d. RS232 communication interface e. Over current and over voltage protection f. Constant current control mode g. Input current: 800 mA/Channel h. Tandem junction automatic measurement function i. 150 W halogen light bias j. 1 m fiber k. Optical lens and holder l. Long pass filter |
QE-R-LUP | Upward Light Direction Test Function |
a. Upward light direction mode b. Upward/ downward switching knob c. Banana signal channel d. Z axis probe* 2 |
◆The comparison with different structure’s HIT Solar Cell by QE-R.
◆ Measuring the EQE of Silicon base Triple Junction Solar Cell by QE-R.
◆ Measuring Solar Cell by QE-R is with slighter difference.
Latest 10 publications referencing QE-R
Tiantian Cao, Peng Huang, Kaicheng Zhang, Ziqi Sun, Kai Zhu, Ligang Yuan, Kang Chen, Ning Chen and Yongfang Li
Journal of Materials Chemistry A, Issue 8, 2018
Seeded Space‐Limited Crystallization of CH3NH3PbI3 Single‐Crystal Plates for Perovskite Solar Cells
Hong‐Lin Yue, Hsin‐Hung Sung and Fang‐Chung Chen
Advanced Electronic Materials
Ho WJ, You BJ, Liu JJ, Bai WB, Syu HJ and Lin CF
Materials, 2018 May 18;11(5)
Pengyang Wang, Qi Jiang, Yang Zhao, Yong Chen, Zema Chu, Xingwang Zhang, Yuqin Zhou and Jingbi You
Science Bulletin, Available online 9 May 2018
Related to: SS-F5-3A
Chunmei Chang, Wanbin Li, Xia Guo, Bing Guo, Chennan Ye, Wenyan Su, Qunping Fan and Maojie Zhang
Organic Electronics, Volume 58, July 2018, Pages 82-87
Related to: SS-F5-3A
Yiming Bai, Bo Yang, Fuzhi Wang, Huiyun Liu, Tasawar Hayat, Ahmed Alsaedi and Zhan'aoTan
Organic Electronics, Volume 52, January 2018, Pages 323-328
Yasuhiro Shirahata and Takeo Oku
Materials Research Express, Volume 5, Number 5
Yi Di, Zhanhai Xiao, Xiaoshuang Yan, Geying Ru, Bing Chen, Jiwen Feng
Applied Surface Science, Volume 441, 31 May 2018, Pages 807-815
Wei Chen, Yinghui Wu, Bao Tu, Fangzhou Liu, Aleksandra B. Djurišić, Zhubing He
Applied Surface Science, available online 30 April 2018
Effects of halide addition to arsenic-doped perovskite photovoltaic devices
Tsuyoshi Hamatani and Takeo Oku
AIP Conference Proceedings, Volume 1929, Issue 1