What is PL?
PL (Photoluminescence) is a non-destructive testing method, in which a substance absorbs high energy incoming photons and then re-emits photons of lower energy. By analyzing the photons emitting from the sample, many key information, such as material characteristics, carrier transmission route, or the carrier lifetime, can be elucidated when examining the PL spectrum. High-efficiency PL measurement systems are critical to the development of the nanomaterials, especially in the Photonics area.
Enlitech adopts both high-sensitivity spectrum measurement system and high-speed/accuracy scanning device on our latest product –Rapid PL Mapper(PLM), a high-performance and cost-effective PL measurement system which can examine samples with a large surface area. PLM can be used to analyze the epitaxial process of various wafers in the R&D stage, and the critical information, such as the spectrum and spatial distribution, can be applied in a wide range of applications from incoming inspection to quality control.
The PLM scan result of a 8” III-V wafer
Enlitech’s PL imaging device—the PL Imager, adopts a high-sensitivity image detector, which is capable to obtain the PL image in a very short time, and has been successfully applied to the III-V group and solar cell materials. Compared to EL images, PL images can be collected from the sample without completing the electrodes, and the results can be analysis can be finished within a few seconds .
The example of PL image