SIM Surface Profiler

Super-Resolution, High Quality, Fast Imaging

The application of structural illumination microscopy enhances the super resolution microscope beyond the optical diffraction limitation. The x,y axis resolution reaches 165 nm, and the z axis resolution reaches 352 nm. The performance is two times higher than conventional optical microscopes. Building with the image algorithm technology/software developed by Enli Tech, the noise of non-focal plane can be accurately eliminated, and the high resolution three-dimensional diagram is produced. This is the best solution with high cost/profit ratio for three-dimensional structure measurement.

◆ Beyond the optical diffraction limitation. Twice the resolution of conventional optical microscopes

Enli Tech SIM Surface Profiler is designed in accordance with the technology of Structured Illumination Microscopy. Through the method of projecting the light pattern onto the focal plane and the build-in image algorithm technology/software, the signal of focal plane is acquired and the noise of the non-focal plane is eliminated. We successfully break through the optical diffraction limitation and the performance of Enli Tech’s 3D Super Resolution Microscope is two times higher than the conventional optical microscopes.

◆ Fast imaging. The Time Resolution of 5 frames/sec

Enli Tech SIM Surface Profiler is equipped with high-speed image capturing performance. The frame rate is 5 fps (frames per second). In other words, every image can be acquired in 0.2 second. The high-speed image capturing performance satisfies the needs of bio-related research.

◆ High resolution 3D imaging technology

Enli Tech SIM Surface Profiler offers the high-resolution, instantaneous and 3D-visualization of sample surface topography.Also SIM Surface Profiler with the system integration can support the the following image formats: 

● Interactive 3D Display

● Line-Profile Analysis Display

● Dynamic 3D Display

▲Morphology of solar cell

◆ Upgrading microscope, Integrating SIM system, Providing total solutions

Enli Tech suggests and customizes different alternatives for customers in accordance with their needs:

● Enli Tech SIM total solution: providing SIM total solution including hardware, software, installation and training.

● Upgrading Microscopes solution: we can also offer the selective modularized solution. For example, if you have the optical microscope already, we can integrate the super resolution structural illuminator into your system and upgrade it to 3D super resolution microscope.

To satisfy user's needs for measuring three-dimensional micro-structures, Enli Tech has further developed three-dimensional super-resolution image technology, integrating spatial-temporal control of the super-resolution structure light source, and a high-speed nano-shift-control system to upgrade the super-resolution structural light source to super resolution microscope.

The super resolution microscope build-in different three-dimensional image algorithm technologies, and it can re-build/construct the surface of bio or non-bio samples in accordance with its optical properties. The application covers:

Industry: semiconductor / material / bio-material

● Three-dimensional structure of IC Chip/MENS (semiconductor)

●  Precision Medical Film structure of Perovskite devices (material)

● Three-dimensional structure of LED electrodes (material)

● Three-dimensional structure of solar cell electrodes (material)

●  Three-dimensional structure of micro-tunnels of bio-chips (bio-material)

- Dynamic 3D Display

▲Morphology of solar cell

▲IC Silicon Chip Structure 3D Display