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Laser Scanning Defect Mapping System (1)

LSD4 Laser Scanning Defect Mapping System

● Can scan the photocurrent distribution of the sample surface.
● Can scan the open-circuit voltage and short-circuit current distribution.
● Can analyze the surface dust of the solar cell.
● Can analyze the short-circuit area.
● Can analyze the diffusion length of minority carrier.
● Can recognize and analyze the defects.
● PV Response Mapping can equip with white light excitation source.